An Improved Thru-Line De-Embedding Technique up to 80 GHz
2022-11-01
Author(s): Lv, SR (Lv, Shirong); Tang, FS (Tang, Fusheng); Jiao, MQ (Jiao, Mingqi); Zhang, SL (Zhang, Shengli); Xie, L (Xie, Liang)
Source: IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE Volume: 25 Issue: 8 Pages: 32-37 Published: NOV 2022
Accession Number: WOS:000864180000010
ISSN: 1094-6969
eISSN: 1941-0123
