Author(s): Leng, YC (Leng, Yu-Chen); Chen, T (Chen, Tao); Lin, ML (Lin, Miao-Ling); Li, XL (Li, Xiao-Li); Liu, XL (Liu, Xue-Lu); Tan, PH (Tan, Ping-Heng)

Source: CARBON Volume: 191 Pages: 471-476 DOI: 10.1016/j.carbon.2022.02.012 Published: MAY 2022

Abstract: Angle resolved polarized Raman (ARPR) spectroscopy has been widely used to study basic properties of two-dimensional materials (2DMs), such as underlying symmetry, mode assignment, crystallographic orientation and optical anisotropy. The substrate effect has never been uncovered in ARPR spectroscopy. In this work, we investigated zenith-angle resolved polarized Raman (ZRPR) spectra of the G mode of graphene (1LG) deposited on different substrates as well as graphite under in-plane and out-of-plane configurations. In contrast to the independent behavior in normal incidence geometry, the G mode in-tensity exhibits obvious zenith-angle dependence. In particular, this polarization behavior is sensitive to the underlying substrates underneath 1LG. The ZRPR intensity of the G mode can be well understood by a model considering both Raman selection rule and zenith-angle resolved interference effect. This work enriches the understanding of polarized Raman spectroscopy of 2DMs and the approach can be appli-cable to other 2DMs, especially in-plane anisotropic 2DMs. (c) 2022 Elsevier Ltd. All rights reserved.

Accession Number: WOS:000760353300011

ISSN: 0008-6223

eISSN: 1873-3891

Full Text: https://www.sciencedirect.com/science/article/pii/S0008622322000896?via%3Dihub