Align and Pool for EEG Headset Domain Adaptation (ALPHA) to Facilitate Dry Electrode Based SSVEP-BCI
Author(s): Liu, BC (Liu, Bingchuan); Chen, XG (Chen, Xiaogang); Li, X (Li, Xiang); Wang, YJ (Wang, Yijun); Gao, XR (Gao, Xiaorong); Gao, SK (Gao, Shangkai)
Source: IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING Volume: 69 Issue: 2 Pages: 795-806 DOI: 10.1109/TBME.2021.3105331 Published: FEB 2022
Abstract: Objective: The steady-state visual evoked potential based brain-computer interface (SSVEP-BCI) implemented in dry electrodes is a promising paradigm for alternative and augmentative communication in real-world applications. To improve its performance and reduce the calibration effort for dry-electrode systems, we utilize cross-device transfer learning by exploiting auxiliary individual wet-electrode electroencephalogram (EEG). Methods: We proposed a novel transfer learning framework named ALign and Pool for EEG Headset domain Adaptation (ALPHA), which aligns the spatial pattern and the covariance for domain adaptation. To evaluate its efficacy, 75 subjects performed an experiment of 2 sessions involving a 12-target SSVEP-BCI task. Results: ALPHA significantly outperformed a baseline approach (canonical correlation analysis, CCA) and two competing transfer learning approaches (transfer template CCA, ttCCA and least square transformation, LST) in two transfer directions. When transferring from wet to dry EEG headsets, ALPHA significantly outperformed the fully-calibrated approach of task-related component analysis (TRCA). Conclusion: ALPHA advances the frontier of recalibration-free cross-device transfer learning for SSVEP-BCIs and boosts the performance of dry electrode based systems. Significance: ALPHA has methodological and practical implications and pushes the boundary of dry electrode based SSVEP-BCI toward real-world applications.
Accession Number: WOS:000745515000031
PubMed ID: 34406934
Author Identifiers:
Author Web of Science ResearcherID ORCID Number
Liu, Bingchuan 0000-0001-5988-6051
Chen, Xiaogang 0000-0002-5334-1728
ISSN: 0018-9294
eISSN: 1558-2531
Full Text: https://ieeexplore.ieee.org/document/9516951