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A Real-Time Circuit Phase Delay Correction System for MEMS Vibratory Gyroscopes

2021-07-09

 

Author(s): Xu, PF (Xu, Pengfei); Wei, ZY (Wei, Zhenyu); Guo, ZY (Guo, Zhiyu); Jia, L (Jia, Lu); Han, GW (Han, Guowei); Si, CW (Si, Chaowei); Ning, J (Ning, Jin); Yang, FH (Yang, Fuhua)

Source: MICROMACHINES Volume: 12 Issue: 5 Article Number: 506 DOI: 10.3390/mi12050506 Published: MAY 2021

Abstract: With the development of the designing and manufacturing level for micro-electromechanical system (MEMS) gyroscopes, the control circuit system has become a key point to determine their internal performance. Nevertheless, the phase delay of electronic components may result in some serious hazards. This study described a real-time circuit phase delay correction system for MEMS vibratory gyroscopes. A detailed theoretical analysis was provided to clarify the influence of circuit phase delay on the in-phase and quadrature (IQ) coupling characteristics and the zero-rate output (ZRO) utilizing a force-to-rebalance (FTR) closed-loop detection and quadrature correction system. By deducing the relationship between the amplitude-frequency, the phase-frequency of the MEMS gyroscope, and the phase relationship of the whole control loop, a real-time correction system was proposed to automatically adjust the phase reference value of the phase-locked loop (PLL) and thus compensate for the real-time circuit phase delay. The experimental results showed that the correction system can accurately measure and compensate the circuit phase delay in real time. Furthermore, the unwanted IQ coupling can be eliminated and the ZRO was decreased by 755% to 0.095 degrees/s. This correction system realized a small angle random walk of 0.978 degrees/root h and a low bias instability of 9.458 degrees/h together with a scale factor nonlinearity of 255 ppm at room temperature. The thermal drift of the ZRO was reduced to 0.0034 degrees/s/degrees C at a temperature range from -20 to 70 degrees C.

Accession Number: WOS:000662415500001

PubMed ID: 33946535

eISSN: 2072-666X

Full Text: https://www.mdpi.com/2072-666X/12/5/506



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