Accurate Calibration and Measurement of Optoelectronic Devices

Author(s): Zhang, SJ (Zhang, Shangjian); Li, W (Li, Wei); Chen, W (Chen, Wei); Zhang, YL (Zhang, Yali); Zhu, NH (Zhu, Ninghua)

Source: JOURNAL OF LIGHTWAVE TECHNOLOGY Volume: 39 Issue: 12 Pages: 3687-3698 DOI: 10.1109/JLT.2020.3010065 Published: JUN 15 2021

Abstract: Frequency responses of optoelectronic devices are essential to obtain the precise performance of electrical-to-optical-to-electrical signal conversion or optical signal processing. We reviewed the development of optical or electrical measurement methods proposed for characterizing electrical/optical (E/O) devices, optical/electrical (O/E) devices and optical/optical (O/O) devices in the frequency domain from the perspective of accurate calibration standard. It has been found that full calibrated E/O or O/E measurement requires at least an optoelectronic thru standard for the conversion between optical and electrical domains, and an electrical port extension for de-embedding the error or adapter network of microwave source or detector. The indetermination problem still exists in most O/E and E/O device characterization, which appears in different forms for different measurement techniques. Nevertheless, it should be noticed that obtaining an optoelectronic thru standard can be transferred to characterizing a microwave source or detector in the electrical domain, and a precise electrical calibration standard is much easier to be obtained as compared with an optoelectronic calibration standard. Therefore, the calibration standard transfer from optical to electrical domain is a prominent approach to solve the indetermination problem.

Accession Number: WOS:000658363000006

ISSN: 0733-8724

eISSN: 1558-2213

Full Text: https://ieeexplore.ieee.org/document/9143411