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Phase Shift Induced by Gate-Controlled Quantum Capacitance in Graphene FET

2021-04-25

 

Author(s): Li, JQ (Li, Jiaqi); Mao, XR (Mao, Xurui); Gu, XW (Gu, Xiaowen); Xie, S (Xie, Sheng); Geng, ZX (Geng, Zhaoxin); Chen, HD (Chen, Hongda)

Source: IEEE ELECTRON DEVICE LETTERS Volume: 42 Issue: 4 Pages: 601-604 DOI: 10.1109/LED.2021.3062367 Published: APR 2021

Abstract: The gate-controlled quantum capacitance and the channel resistance play an important role in the performance of graphene field-effect transistors (GFETs). This paper experimentally verifies that the output phase of the graphene field-effect transistor changes under the influence of quantum capacitance and the channel resistance, which are controlled by the gate voltage. This phenomenon is theoretically analyzed, and a model is established to simulate the phase shift. The obtained simulation results of the model are in good agreement with the experimental results. This work reveals the influence of gate voltage variation on the phase characteristics of GFETs and provides a research basis for the application of GFETs in phase shifter and the establishment of the small-signal model.

Accession Number: WOS:000633394000037

ISSN: 0741-3106

eISSN: 1558-0563

Full Text: https://ieeexplore.ieee.org/document/9363933



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