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A study of contact properties between molybdenum and amorphous silicon tin oxide thin film transistors

2018-12-20

Authors: Ning, HL; Liu, XZ; Xu, H; Lu, KK; Zhang, HK; Zhang, XC; Yao, RH; Fang, ZQ; Wang, XF; Peng, JB
JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY
Volume: 26 Issue: 12 Pages: 681-686 Published: DEC 2018 Document type: Article
DOI: 10.1002/jsid.735
全文链接:https://onlinelibrary.wiley.com/doi/10.1002/jsid.735

 

 



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