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Degradation behavior of deep UV-LEDs studied by electro-optical methods and transmission electron microscopy

2018-12-06

Authors: Xiu, HX; Zhang, Y; Fu, JJ; Ma, ZH; Zhao, LX; Feng, JJ
CURRENT APPLIED PHYSICS
Volume: 19 Issue: 1 Pages: 20-24 Published: JAN 2019 Document type: Article
DOI: 10.1016/j.cap.2018.10.019
全文链接:https://www.sciencedirect.com/science/article/pii/S156717391830289X

 

 



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