Enhancement of Electrical Characteristics and Stability of Amorphous Si-Sn-O Thin Film Transistors with SiOx Passivation Layer
2018-09-27
Enhancement of Electrical Characteristics and Stability of Amorphous Si-Sn-O Thin Film Transistors with SiOx Passivation Layer
Authors: Liu, XZ; Wu, WJ; Chen, WF; Ning, HL; Zhang, XC; Yuan, WJ; Xiong, M; Wang, XF; Yao, RH; Peng, JB
MATERIALS
Volume: 11 Issue: 8 Published: AUG 2018 Document type: Article
DOI: 10.3390/ma11081440
全文链接:https://www.mdpi.com/1996-1944/11/8/1440