[黄昆论坛]第342期：Cost-Effective Techniques for Analog Design, Analog Fault Coverage, and Fast and Accurate Testing of High Resolution ADCs
2019-05-31
报告题目：Cost-Effective Techniques for Analog Design, Analog Fault Coverage, and Fast and Accurate Testing of High Resolution ADCs
报告人：Prof. Degang Chen (IEEE Fellow, Junkins Chair Professor of Electrical and Computer Engineering, Iowa State University, USA)
报告时间：2019年6月11日(星期二) 上午10：00
报告地点：中国科学院半导体研究所2号楼303A会议室
